A tips for STDF here for reference.
Some notes for STDF while do STDF data parsing....
stdf is a binary file type, so we need a tool to read it or convert to text-based file then can view the content.
you can google stdf tool then can get some useful information...
STDF SPEC(V4)
STDF_V4 http://freefr.dl.sourceforge.net/project/freestdf/docs/STDF-v4-spec.pdf
ATDF file structure
- note, it's converted thorough stdf2atdf, and atdf is a text format. that will help us to understand the file structure.
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- Far:2|4 File Attributes Record: CPU_TYPE| STDF_VER, first line to indicate stdf version
- Atr:1466398194|dataformatter tester config; Ver: SmarTest s/w rev. 7.1.4.6 (E), 05-Feb-13; dataformatter 2.0.12 Feb 5 2013 11:55:26 Audit Trail Record:
- Mir:12:48:19 20-Jun-2016|12:49:54 20-Jun-2016|1| |N| |65535| |0||suz93k15|93000-SOC|SAMOA_S3PRO_A0F1P_250revH|||demo|93000|s/w rev. 7.1.4.6
- SETUP_T| START_T| STAT_NUM| MODE_COD| RTST_COD| PROT_COD| BURN_TIM| CMOD_COD| LOT_ID| PART_TYP|NODE_NAM|TSTR_TYP|…SBLOT_ID|OPER_NAM
- Sdr:1|2|2|1,2||||||||||||||||
- Test head number|Site group number|Number (k) of test sites in site group|Array of test site numbers
- Pmr:1|0|ADBIA0|11411|L18|1|1 Pin Map Record: PMR_INDX|CHAN_TYP|CHAN_TYP|PHY_NAM|LOG_NAM|HEAD_NUM|SITE_NUM
- Dtr:AMD_Header_Start Datalog Text Record:
674 Dtr:AMD_Header_Start 675 Dtr:Lot_ID: G0093579 676 Dtr:Part_Number: 215-0869014-00 677 Dtr:ERC_ID: N 678 Dtr:Schedule_WO_ID: THT168.00 679 Dtr:IN_QTY: 540 680 Dtr:Production_Test: Y 681 Dtr:Correlation: N 682 Dtr:Eng_Screening: N 683 Dtr:Retest: N 684 Dtr:Retest_BIN: NA 685 Dtr:Load_Board_ID: 2A-OLS3BGAC01 686 Dtr:Tester_ID: 93KC15 687 Dtr:Handler_ID: HGTC01 688 Dtr:Temperature: 100 689 Dtr:Remark: N 690 Dtr:Test_House_ID: HTEST1 691 Dtr:Platform: P 692 Dtr:Hostname: suz93k15 693 Dtr:Operator_ID: demo 694 Dtr:Test_program: SAMOA_S3PRO_A0F1P_250revH 695 Dtr:DateTime: 20160620044927 696 Dtr:Software_REV: 7.1.4.6 697 Dtr:Software_DATE: 20130205 698 Dtr:CalDate: 20160516 699 Dtr:HDCPServer1: 10.72.28.2 700 Dtr:HDCPServer2: 10.72.28.3 701 Dtr:Device_code: SAMOA_S3PRO 702 Dtr:Test_Type: F 703 Dtr:Test_Stage: 1 704 Dtr:Soaking_Time: 0 705 Dtr:AMD_OMI_REV_ID: 160 706 Dtr:PH_driver_id: "General Handler Driver 5.2.0_test (local version /opt/93000/src/tci/handler/frame/src)" compiled at Tue Feb 5 11:07:39 CET 707 Dtr:PH_plugin_id: "Seiko-Epson GPIB driver 5.2.0_test (local version /opt/93000/src/tci/handler/Seiko-Epson/func)" compiled at Tue Feb 5 10:4 708 Dtr:PH_equipment_id: equipment_id_not_available 709 Dtr:PH_family: handler_family: < F > "Seiko-Epson" 710 Dtr:PH_model: model: < F > "NS6000" 711 Dtr:PH_plugin: driver_plugin: "/opt/hp93000/soc/PH_libs/GenericHandler/Seiko-Epson/" 712 Dtr:PH_config: configuration: "/opt/hp93000/soc/PH_libs/GenericHandler/Seiko-Epson/config/NS6000-GPIB-2.cfg" 713 Dtr:AMD_Header_End 714 Pir:1|1 715 Pir:1|2 716 Dtr:++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++ 717 Dtr:OMI Part Number is(215-0869014-00)match load file Device Code Name(SAMOA_S3PRO) 718 Dtr:++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++ 719 Dtr:++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++ 720 Dtr:OMI Part Number is(215-0869014-00)match load file Device Code Name(SAMOA_S3PRO) 721 Dtr:++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++ 722 Dtr:Device Code Name = SAMOA_S3PRO 723 Dtr:Device Code Name = SAMOA_S3PRO
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- Ptr:2000000483|1|1|0|192|-0.198845997453|AllPin_BOTH_NEG_CONT:Continuity@PCIE_TX5N[1]||14|3|3|3|-1.0|-0.10000000149|V|%7.9f|%7.9f|%7.9f|0.0|0
- Parametric Test Record:
- Mpr:2000000594|1|1|0|0|19|19||0.0,0.0,0.0,0.0,0.0,0.0,0.0,0.0,0.0,0.0,0.0,0.0,0.0,0.0,0.0,0.0,0.0,0.0,0.0|EVDDQ_PS_Current_Monitor:DPS_Status
- Multiple-Result Parametric Record:
- Ftr:2000000602|1|1|0|247|0|0|1|0|0|0|0|0|0|||||[]|oland_A0_tst_reg_rw_anno_posttdo_plist|64,1,1||JTAG_TST_REG_NOM:Functional[1]||||255|[]
- Functional Test Record: TEST_NUM|HEAD_NUM|SITE_NUM|TEST_FLG(fail, alarm, etc.)| OPT_FLAG|CYCL_CNT|REL_VADR|REPT_CNT|REPT_CNT|XFAIL_AD|yFAIL_AD|VECT_OFF|RTN_ICNT|…..
- Gdr:240|0| EfuseCapt_Allbits_Zero EfuseCapt_Allbits_Zero PASS Generic Data Record: FLD_CNT|GEN_DATA
- Dtr:LOT_ID =1402925076
- Ptr:2000000483|1|1|0|192|-0.198845997453|AllPin_BOTH_NEG_CONT:Continuity@PCIE_TX5N[1]||14|3|3|3|-1.0|-0.10000000149|V|%7.9f|%7.9f|%7.9f|0.0|0
2139 Dtr:LOT_ID =1402925076 2140 Dtr:WAFER_ID =23 2141 Dtr:WAFER_X =30 2366 Dtr:WS_WAFER_X =30 2370 Dtr:WAFER_Y =14 2380 Dtr:WS_WAFER_Y =14 2414 Dtr:WS_LOT_ID_WAFER_ID = 761549063 2415 Dtr:WS_LOT_ID = THT168 2416 Dtr:WS_WAFER_ID = 23 2417 Dtr:WS_WAFER_X = 30 2418 Dtr:WS_WAFER_Y = 14 2419 Dtr:WS_CHECK_BIT = 0 2420 Dtr:LOT_ID = THT168 2421 Dtr:WAFER_ID = 23 2422 Dtr:WAFER_X = 30 2423 Dtr:WAFER_Y = 14 2426 Gdr:240|0| EfuseCapt_Allbits_Zero EfuseCapt_Allbits_Zero PASS 2622 Dtr:<SerialEfuse read> Site = 2
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- uid and sb result section.
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3614 Dtr:Test_House_ID = HTEST1 3615 Dtr:Unit ID = THT168233014 3616 Dtr:SMS_Key = SMS_REPAIR_JPC0_ULSD_A000 3617 Dtr:result_s0 = 100 3618 Dtr:Test_House_ID = HTEST1 3619 Dtr:Unit ID = THT168232215 3620 Dtr:SMS_Key = SMS_REPAIR_JPC0_ULSD_A000 3621 Dtr:result_s0 = 100
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- PRR(Part Result Record) and PIR(Part Information Record)
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- HEAD_NUM U*1 Test head number Head ID
- SITE_NUM U*1 Test site number Site ID
- PART_FLG B*1 Part information flag
- NUM_TEST U*2 Number of tests executed test#
- HARD_BIN U*2 Hardware bin number HB HB
- SOFT_BIN U*2 Software bin number 65535 SB
- X_COORD I*2 (Wafer) X coordinate -32768
- Y_COORD I*2 (Wafer) Y coordinate -32768
- TEST_T U*4 Elapsed test time in milliseconds 0 test time with ms
- PART_ID C*n Part identification length byte = 0
- PART_TXT C*n Part description text length byte = 0 start test time
- PART_FIX B*n Part repair information length byte = 0
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6492 Prr:1|1|0|1634|1|1|-32768|-32768|11479|1|StartTime:20160620044929|[] 6493 Prr:1|2|0|1634|1|1|-32768|-32768|11479|2|StartTime:20160620044929|[] 6494 Pir:1|1 6495 Pir:1|2
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- Final results for entire lot
- Test Synopsis Record (TSR): used to identify test class failure count vs. test count and test time etc….
- Final results for entire lot
oHEAD_NUM U*1 Test head number See note oSITE_NUM U*1 Test site number oTEST_TYP C*1 Test type space oTEST_NUM U*4 Test number oEXEC_CNT U*4 Number of test executions 4,294,967,295 oFAIL_CNT U*4 Number of test failures 4,294,967,295 oALRM_CNT U*4 Number of alarmed tests 4,294,967,295 oTEST_NAM C*n Test name length byte = 0 oSEQ_NAME C*n Sequencer (program segment/flow) name length byte = 0 oTEST_LBL C*n Test label or text length byte = 0 oOPT_FLAG B*1 Optional data flag See note oTEST_TIM R*4 Average test execution time in seconds OPT_FLAG bit 2 = 1 oTEST_MIN R*4 Lowest test result value OPT_FLAG bit 0 = 1 oTEST_MAX R*4 Highest test result value OPT_FLAG bit 1 = 1 oTST_SUMS R*4 Sumof test result values OPT_FLAG bit 4 = 1 oTST_SQRS R*4 Sum of squares of test result values OPT_FLAG bit 5 = 1
360553 Tsr:1|1|P|2000000010|63|0|4294967295|POWER_SHORT_VSVM:PowerShort_VSVM@VDDC[1]|||200|0.0172914955765|0.100188463926|0.100311107934|6.312486648 56|0.0
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- HBR(Count of parts placed in each hardware bin), SBR(Count of parts assigned to each logical bin), PCR(Part count totals for lot), MRR(Global summary of results for entire lot)
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367823 Hbr:1|1|1|60|P|GD1 Count of parts placed in each hardware bin, HEAD_NUM|SITE_NUM|COUNT|PorF flag|SB Description 367824 Hbr:1|2|1|52|P|GD1 367825 Hbr:255|0|1|112|P|GD1 HEAD_NUM = 255, the count is for all test sites 367826 Hbr:1|1|5|3|F|FUNC_SCAN_SMS_ANALOG_EFUSE_ULSD 367827 Hbr:1|2|5|10|F|FUNC_SCAN_SMS_ANALOG_EFUSE_ULSD 367828 Hbr:255|0|5|13|F|FUNC_SCAN_SMS_ANALOG_EFUSE_ULSD 367829 Sbr:1|1|1|60|P|GD1 367830 Sbr:1|2|1|52|P|GD1 367831 Sbr:255|0|1|112|P|GD1 367832 Sbr:1|1|92|2|F|FUSE_Read 367833 Sbr:1|2|92|10|F|FUSE_Read 367834 Sbr:255|0|92|12|F|FUSE_Read 367835 Sbr:1|1|458|1|F|Defect_Grp1 367836 Sbr:255|0|458|1|F|Defect_Grp1 367837 Pcr:1|1|63|0|4294967295|60|4294967295 367838 Pcr:1|2|62|0|4294967295|52|4294967295 367839 Pcr:255|0|125|0|4294967295|112|4294967295 367840 Mrr:13:07:10 20-Jun-2016| ||
end...
UID rule
- some multi-site testers data file (stdf or kdf) will has only single uid in a touch down but Prr or Unit field will record both, that is same as UBS KDF file, so I will to generate a false UID for another one and align with AMD's practice.
- UID generate rule: LOTID+TESTERID+UNITDATE+SITEID+UNITSEQ